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BECKMAN COULTER

LS 13 320 XR Particle Size Analyzer

NEW
One of the most versatile and sophisticated laser diffraction particle size analyzers available today.
QUOTATION
INFORMATION
QUOTATION
INFORMATION
DESCRIPTION DOWNLOAD STANDARDS VIDEO
DESCRIPTION

 

For big improvements that help you spot small differences.

The LS 13 320 XR offers best-in-class particle size distribution data from advanced PIDS technology,* which enables high-resolution measurements and an expanded dynamic range. Like the LS 13 320, the XR analyzer provides fast, accurate results, and helps you streamline workflows to optimize efficiency. Some big improvements help you reliably spot small differences that can have a huge impact on your particle analysis data.

  • Direct measurement range from 10 nm – 3,500 µm
  • Automatically highlights pass/fail results for faster quality control
  • Enhanced software that simplifies method creation for standardized measurements

 


 

Features

Spot Small Differences

  • Expanded measurement range: 10 nm – 3,000 µm

  • Laser diffraction plus advanced Polarization Intensity Differential Scattering, PIDS,

    technology enable high-resolution measurement & reporting of real data down to 10 nm

  • Provides accurate, reliable detection of multiple particle sizes in a single sample

Easy-To-Use Software

  • Automatic pass/fail check

  • Pre-configured methods deliver results with 3 clicks or less

  • Simplifies analyzer operation by experts & novice users alike

  • 1-click overlay with historical data

  • Intuitive user diagnostics keep you informed during sampling

  • Simplified method creation for standardized measurements

21 CFR Part 11 Compliance

  • Customizable security system to meet diverse needs

  • Choose from 4 security levels

  • High-security configuration supports 21 CFR Part 11 compliance

    (the FDA regulation for electronic signatures/records)

PIDS Technology* for Direct Detection of 10 nm Particles

  • 3 light wavelengths (450, 600, & 900 nm) irradiate samples with vertical

    & horizontal polarized light

  • Analyzer measures scattered light from samples over a range of angles

  • Differences between horizontally & vertically radiated light for each wavelength

    yield high-resolution particle size distribution data

  Specifications

Platform

LS Series

Light Source

Diffraction: Solid-state (780 nm) PIDS: Tungsten lamp with high-quality band-pass filters (450, 600 and 900 nm)

Particle Size Analysis Range

10 nm|3000µm|

Operating System

Microsoft OS

Temperature Range

10°C - 40°C

Humidity Restrictions

0 - 90% without condensation

Power Requirements

6A at 90-125 VAC, 3 A at 220-240 VAC

Software

ADAPT Software

       

DOWNLOAD
STANDARDS
VIDEO
BECKMAN COULTER website
BECKMAN COULTER
Solutions and systems for clinical diagnostics (hematology, biochemistry, immunoassays, flow cytometry. Solutions for industry & research, for genetics, proteomics and cellular analysis. Lab automated workstation & liquid handling workstation.
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Prices are quoted in euro (taxes excluded) and apply in the Benelux (recycling fee included). They are subject to change without notice. We reserve the right to adjust pricing errors and to limit quantities.

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