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NIKON METROLOGY

Upright Microscope ECLIPSE LV 150N

A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields.
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QUOTATION
INFORMATION
DESCRIPTION KEY FEATURES SPECIFICATIONS BROCHURES
DESCRIPTION
NIKON METROLOGY Upright Microscopes - sophisticated solutions for the most varied applications>
Legendary Nikon optics in each Nikon upright microscope provide superb images over the entire magnification range.

Eclipse LV150N

A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging.
Max. sample size: 150 x 150 mm

Applications
Telecom & Electronics, Antennae, Implants/Protheses, Telescope optics, Surface Examination, Wafers

 

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NIKON METROLOGY website
This item belongs to the following categories (click to expand):
Prices are quoted in euro (taxes excluded) and apply in the Benelux (recycling fee included). They are subject to change without notice. We reserve the right to adjust pricing errors and to limit quantities.

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